Rigaku X-Ray Diffraction and X-Ray Fluorescence Instrumentation

Since its inception, Rigaku has been at the forefront of analytical and industrial instrumentation technology. Today, with hundreds of major innovations to their credit, the Rigaku Group of Companies is a world leader in the fields of general X-ray diffraction, thin film analysis, X-ray spectrometry, SAXS, protein and small molecule X-ray crystallography, Raman spectroscopy, X-ray optics, semiconductor metrology, protein crystallization automation, X-ray sources, computed tomography, non-destructive testing and thermal analysis. This year we are proudly celebrating the 60th anniversary of our founding, which occurred in December of 1951.

Elemental analysis by X-ray fluorescence (XRF) spectroscopy

For the elemental analysis of ores, feeds, tails and slags, or for geologic exploration, Rigaku offers a broad range of instrumentation products. From low-cost transportable energy dispersive X-ray fluorescence (EDXRF) analyzers and high-performance laboratory EDXRF spectrometers to powerful sequential wavelength dispersive X-ray fluorescence (WDXRF) and high-throughput simultaneous WDXRF spectrometers, Rigaku offers the most complete range of XRF elemental analysis instrumentation.

Energy dispersive X-ray fluorescence (EDXRF) – elemental analysis

As a premium low-cost benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control elemental analysis applications. Rigaku NEX CG, with Cartesian optical geometry, delivers rapid qualitative and quantitative determination of major and minor atomic elements in complex geologic matrices with minimal standards.

Wavelength dispersive X-ray fluorescence (WDXRF) – elemental analysis

The world’s only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of fluorine (F) through uranium (U) of almost any material, Rigaku Supermini uniquely delivers low cost-of-ownership (COA) with high resolution and lower limits-of-detection (LLD). Rigaku ZSX Primus WDXRF delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), while the X-ray tube-above ZSX Primus II offers the advantage of lower risk of instrument contamination from powdered samples.

The Simultix 14 is the newest version of our popular multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system. Based on over 30 years of accumulated experience, the Simultix 14 stands out as the most advanced, fully automated system available – designed to meet today’s analytical needs for utmost sensitivity, throughput, and versatility.

Phase analysis by X-ray diffraction (XRD)

For the phase analysis of ores, feeds, tails and slags, or for geologic exploration, Rigaku offers a broad range of X-ray diffraction instrumentation products. Rietveld analysis of X-ray diffraction data is now recognized as the most powerful method available for quantitative crystalline phase analysis. From low-cost transportable X-ray diffraction (XRD) instruments to high-performance laboratory diffractometers, Rigaku offers the most complete line of XRD analysis instrumentation.

Fifth generation benchtop X-ray diffractometer – phase analysis

Ideally suited for today’s fast-paced XRD analyses, the new fifth generation Rigaku MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high-speed detector coupled with the new 600W X-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, MiniFlex is the only benchtop XRD system with an available sample changer.

Multipurpose X-ray diffraction (XRD) system

The Rigaku Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku’s patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can rapidly perform many different measurements.

In the Ultima IV XRD system, CBO technology eliminates time spent switching geometries, enables everyday users to run both sets of experiments without the need to reconfigure the system, and reduces wear and possible optic damage associated with the recurrent switching process. CBO and automatic alignment combine for the ultimate in functionality for: micro-crystalline diffraction, thin-film diffraction, small angle scattering, and in-plane scattering.

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Press Release

Rigaku Handheld Raman Analyser Progeny™ Wins IBO Award

Rigaku Raman Technologies, a leading pioneer of handheld and portable Raman spectrometers, is delighted to announce that its handheld Raman analyser, Progeny™ has received the Bronze Award for the Portable Analytical Instrument Industrial Design category in the 2014 Instrument Business Outlook (IBO) design awards.

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Rigaku Newsletter – Crystallography in the News

A method described in nature makes X-ray crystallography of small molecules simpler, faster and more sensitive, largely doing away with the laborious task of coaxing molecules to form crystals.

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Press Release

5 September 2014

Rigaku Raman Technologies, a leading pioneer of handheld and portable Raman spectrometers, is delighted to announce that its handheld Raman analyser, Progeny™ has received the Bronze Award for the Portable Analytical Instrument Industrial Design category in the 2014 Instrument Business Outlook (IBO) design awards.

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21 January 2013

Rigaku Corporation today announced a new method for silicate rock analysis by wavelength dispersive X-ray fluorescence spectrometry (WDXRF). Application Note XRF 5018 describes silicate rock analysis by the fusion method, highlighting the performance of the Rigaku ZSX Primus II WDXRF spectrometer, and includes details for sample preparation, method calibration and repeatability.

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4 September 2012

Rigaku announced today the release of the Supermini200 wavelength dispersive X-ray fluorescence (WDXRF) spectrometer, an enhanced version of the Rigaku Supermini, their popular benchtop WDXRF spectrometer and the newest addition to the broadest line of laboratory XRF instruments available today.

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4 July 2012

Applied Rigaku Technologies is pleased to publish a new application report which details the analysis of sulfur in coal using the Rigaku NEX QC EDXRF analyzer. Rigaku Application Note #1231 demonstrates the capability of energy dispersive X-ray fluorescence spectrometry (EDXRF) for cost-effective measurement of sulphur in coal.

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6 June 2012

Rigaku Americas Corporation is pleased to announce that the University of Dundee, Scotland, has chosen to update their X-ray crystallography facility with the most advanced fully automated protein crystallography system from Rigaku. The new equipment includes the Rigaku MicroMax 007HF generator, a VariMax VHF optic, Saturn 944HG CCD detector and ACTOR robotic sample changer. The new facility will complement their existing Rigaku automated protein crystallization platform.

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4 June 2012

Applied Rigaku Technologies, Inc. today announced a new empirical method for the elemental analysis of measurement of silver (Ag) as well as other precious metals in barite (BaSO4) ore.

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21 May 2012

Applied Rigaku Technologies, Inc. today announced a new empirical method for the elemental analysis of analysis of titanium and iron in kaolin clay. Application Note #1187 demonstrates the effectiveness of the filtered direct excitation design of the Rigaku NEX QC energy dispersive X-ray fluorescence (EDXRF) analyzer for analysis during the QA/QC process in the production of clay-based products.

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16 May 2012

Applied Rigaku Technologies, Inc. today announced a new empirical method for the analysis of iron oxide in silica sand. Application Note #1177 demonstrates the effectiveness and utility of the Rigaku NEX QC energy dispersive X-ray fluorescence (EDXRF) analyser in the monitoring of iron content of silica sand.

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Regional Offices

Rigaku Corporation

9009 New Trails Drive

The Woodlands

Houston

77381-5209

Texas

United States of America

+1 281 362 2300 +1 281 364 3628 www.rigaku.com

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