X-Ray Diffraction and X-Ray Fluorescence Instrumentation
Since its inception, Rigaku has been at the forefront of analytical and industrial instrumentation technology. Today, with hundreds of major innovations to their credit, the Rigaku Group of Companies is a world leader in the fields of general X-ray diffraction, thin film analysis, X-ray spectrometry, SAXS, protein and small molecule X-ray crystallography, Raman spectroscopy, X-ray optics, semiconductor metrology, protein crystallization automation, X-ray sources, computed tomography, non-destructive testing and thermal analysis. This year we are proudly celebrating the 60th anniversary of our founding, which occurred in December of 1951.
Elemental analysis by X-ray fluorescence (XRF) spectroscopy
For the elemental analysis of ores, feeds, tails and slags, or for geologic exploration, Rigaku offers a broad range of instrumentation products. From low-cost transportable energy dispersive X-ray fluorescence (EDXRF) analyzers and high-performance laboratory EDXRF spectrometers to powerful sequential wavelength dispersive X-ray fluorescence (WDXRF) and high-throughput simultaneous WDXRF spectrometers, Rigaku offers the most complete range of XRF elemental analysis instrumentation.
Energy dispersive X-ray fluorescence (EDXRF) – elemental analysis
As a premium low-cost benchtop energy dispersive X-ray fluorescence (EDXRF) spectrometer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control elemental analysis applications. Rigaku NEX CG, with Cartesian optical geometry, delivers rapid qualitative and quantitative determination of major and minor atomic elements in complex geologic matrices with minimal standards.
Wavelength dispersive X-ray fluorescence (WDXRF) – elemental analysis
The world’s only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of fluorine (F) through uranium (U) of almost any material, Rigaku Supermini uniquely delivers low cost-of-ownership (COA) with high resolution and lower limits-of-detection (LLD). Rigaku ZSX Primus WDXRF delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), while the X-ray tube-above ZSX Primus II offers the advantage of lower risk of instrument contamination from powdered samples.
The Simultix 14 is the newest version of our popular multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system. Based on over 30 years of accumulated experience, the Simultix 14 stands out as the most advanced, fully automated system available – designed to meet today’s analytical needs for utmost sensitivity, throughput, and versatility.
Phase analysis by X-ray diffraction (XRD)
For the phase analysis of ores, feeds, tails and slags, or for geologic exploration, Rigaku offers a broad range of X-ray diffraction instrumentation products. Rietveld analysis of X-ray diffraction data is now recognized as the most powerful method available for quantitative crystalline phase analysis. From low-cost transportable X-ray diffraction (XRD) instruments to high-performance laboratory diffractometers, Rigaku offers the most complete line of XRD analysis instrumentation.
Fifth generation benchtop X-ray diffractometer – phase analysis
Ideally suited for today’s fast-paced XRD analyses, the new fifth generation Rigaku MiniFlex delivers speed and sensitivity through innovative technology enhancements such as the optional D/teX high-speed detector coupled with the new 600W X-ray source. The optional graphite monochromator, coupled with the standard scintillation counter, maximizes sensitivity by optimizing peak-to-background ratios. If resolution is paramount, incident and diffracted beam slits can be selected to provide the desired resolution. For high sample throughput, MiniFlex is the only benchtop XRD system with an available sample changer.
Multipurpose X-ray diffraction (XRD) system
The Rigaku Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku’s patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray diffractometer can rapidly perform many different measurements.
In the Ultima IV XRD system, CBO technology eliminates time spent switching geometries, enables everyday users to run both sets of experiments without the need to reconfigure the system, and reduces wear and possible optic damage associated with the recurrent switching process. CBO and automatic alignment combine for the ultimate in functionality for: micro-crystalline diffraction, thin-film diffraction, small angle scattering, and in-plane scattering.