Bruker AXS - Phase Analysis and Crystalline Structure Research and Quality Control Instrumentation

Bruker AXS is a global market and technology leader in materials research and quality control instrumentation for elemental analysis and crystalline structure investigations. Bruker AXS offers a complete range of specific solutions for fast and accurate quantitative mineralogy based on X-ray diffraction (XRD) systems.

X-ray powder diffraction systems

Bruker AXS is the worldwide leading supplier for advanced X-ray diffraction solutions. Continual innovation in X-ray sources, optics, detectors, software and sample handling ensures that Bruker AXS is able to offer a diffraction solution for virtually any kind of X-ray analytical task. Expert and professional application, sales, training and service are in place to support the customer.

Quantitative mineralogy XRD systems

Our flexible diffraction solution cover user needs from research facilities to fully automated industrial laboratories. In rock and mineral analysis this includes:

• Support of the field geologist during exploration
• Investigation of run-of-mine material that helps find optimum processing conditions
• Study of the mineral phase content, which saves money, fuel and chemicals in the refinery, aids achieving maximum yield and reduces emissions
• Quality and product control during processing of minerals and waste management
• Control of incoming and outgoing goods
• Surveillance of occupational health issues, e.g. silica or asbestos dust monitoring

Our analytical solutions range from the quantitative analysis of just a few microgram of material (e.g. respirable silica dust on filter papers) to relative weight percentage of amorphous or crystalline phases. Our solutions are applicable to raw and processed materials from iron and ferro-alloy metals mining, non-ferrous metals, precious metals, industrial minerals, as well as to mineral fuels.

XRD diffractometers

Our diffractometers are of a modular design, enabling easy interchanges of optics, sample environments and detectors. With the largest available variety of different components, we have the optimum configuration for your application.

Sample handling is virtually unlimited: sample spinners and changers, temperature and humidity chambers are all available on the D8 platform. Point, one-dimensional and two-dimensional detectors can be optimized for the analytical task at hand.

On-site crystalline phase analyzer

The D2 PHASER is the fastest and most compact all-in-one on-site crystalline phase analyzer available on the market. The price/performance leader for powder XRD is ideally suited for on-site quality and production control.

High sample-throughput XRD system

The D4 ENDEAVOR is an XRD solution for high sample-throughput: it provides optimum performance for on-line process and quality control in the mining and geology, aluminium, cement, chemistry and pigment industries. It performs qualitative and quantitative crystalline phase analysis, peak profile analysis, residual stress determination and structure solutions.

All-purpose research, development and quality control diffractometer

D8 ADVANCE is the world's first truly all-purpose diffractometer for research, development and quality control applications. The innovative design of the new D8 ADVANCE plausibly combines operating safety, ease of use and user safety. Well-matched hardware, electronics and software ensure an easy adaptation to any application in the field of X-ray powder diffraction.

Equipped with the 90-sample AUTOCHANGER, it is perfectly suited to investigate large sample batches by means of X-ray powder diffraction.

Diffraction data measurement and analysis software

Top-of-the-range, award-winning software is available for unravelling your minerals' secrets. The DIFFRAC.SUITE and DIFFRACplus software provide a common look and feel for measurement and analysis software. Powerful tools are provided to analyze your diffraction data and to provide information on the phase content, the phase composition, crystal structure and microstructure, crystallinity or crystallite size.

Diffraction data evaluation and presentation graphics program

EVA is a comprehensive and extremely versatile graphics program for easy, fast and convenient two and three-dimensional data evaluation and presentation. A complete collection of the best algorithms for powder diffraction data is provided. In combination with the ICDD powder diffraction file or with a user database, semi-quantitative phase analysis and combined XRD-XRF are available.

The latter allows validation and improvement of quantitative phase analyses using elemental analysis results. Direct access to SPECTRAplus XRF databases, formatted ASCII-files, automatic data evaluation and automatic printing of graphics and numerical results enable modern, completely integrated lab automation and more.