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Oxford Instruments offers a range of analytical instruments designed for demanding quality control applications in both the field and the laboratory. The new portable X-MET5000 X-ray fluorescence (XRF) analyser is purpose-built for the most demanding quality control applications: scrap metal recycling, analysis of metals for PMI, screening for lead in toys and consumer products for RoHS compliance testing. The X-MET5000 also serves the needs of mining processes for ore exploration, as well as the measurement of heavy metals in soils for environmental monitoring. The X-MET5000 represents the fourth generation of Oxford Instruments' hand-held analyzers. This design experience combined with Oxford Instruments’ patented PentaFET detector technology guarantees fast analysis and lower detection limits for all elements of interest for ore exploration and on-site excavation control in mines. THE NEW X-MET5000 X-RAY FLUORESECENCE ANALYSERThe NEW X-MET5000 is an irreplaceable tool for fast, on-site elemental analysis of exploration samples in mines. The X-MET5000 can measure directly on drill cores, or the sample can be prepared for a more accurate analysis. Multi-element ores can be reliably analyzed. Minimizing the need for laboratory analysis, the X-MET5000 can be the sole decision making tool. Advantages of the new X-MET5000 include:
ENVIRONMENTAL MONITORING AND SOIL ANALYSISThe X-MET5000 is the only analyser you'll need for a broad range of applications including environmental monitoring and soil analysis. The new X-MET5000 provides accurate and reliable identification of pollutants, as well as fast, single-shot, heavy element analysis for lead, chromium, copper, zinc, nickel, cadmium, cobalt, selenium, mercury and others. The analyser is capable of defining the extremities of hotspots in seconds, and with immediate and easy data transfer to a PC, this ensures maximum analysis without time wasted waiting for results. Extremely accurate, the X-MET500 offers pinpoint analysis of heavy elements present in the soil, and allows users to pre-sort contaminated soil to minimise landfill costs. With the X-MET5000’s time-saving features, decision can be made in minutes instead of days. Measurement time is quick: between 20 – 120 seconds, depending on the elements of interest and the required accuracy. The X-MET5000 measures all of the 26 elements defined in EPA6200, and requires low detection limits for all critical elements, typically 5 - 30ppm. In addition, the analyser automatically calculates averages of 2-50 measurements and saves both individual results and average results in a log file. TWIN-X BENCH-TOP ANALYZERThe Twin-X bench-top analyzer provides simple, accurate XRF analysis for minerals and mining in the laboratory. Its advantages include:
For more information, please contact:
Oxford Instruments Industrial Analysis
Halifax Road High Wycombe Bucks HP12 3SE United Kingdom Tel: +44 1494 479274 Fax: +44 1494 524129 Email: fi-espoo_info@oxinst.com URL: www.oxford-instruments.com |
![]() Direct surface measurement from a drill hole sample is quick, or measurement can be done from a plastic bag or sample cup in the bench-top mode. |
![]() Fast, on-site elemental analysis of mineral samples on excavations. | |
![]() The X-MET5000 withstands all weather conditions and rough treatment and is perfect for the harsh conditions of a mine. | |
![]() The rugged and reliable X-MET5000 defines the extremities of ‘hotspots’ in seconds. | |
![]() Twin-X for analysis of solids, liquids and powders. |