Bruker AXS: Press Releases

X-Ray Metrology Study of the SiGe Epitaxial Layer on a Patterned Wafer
Thursday, May 06, 2010 by Bruker AXS Smaller, faster, and better are always the primary goals for the development of innovative semiconductor devices. Smaller, faster and more efficient – are the most important factors...

Chemical Structures at the Touch of a Button with the SMART X2S
Friday, April 30, 2010 by Bruker AXS Modern research moves at breakneck speed. So should structure determination. The award winning SMART X2S produces 3D structures at the touch of a button, quickly, simply, and cost effectively. ...